New paper in OLEN about triplicator gratings displayed in pixelated SLMs at the Nyquist limit
Our last paper is published in Optics & Lasers in Engineering entitled Analysis of diffraction gratings displayed in spatial light modulators at the Nyquist limit: Application to the triplicator grating.
Here we analyze diffraction gratings displayed on a pixelated SLM at its spatial resolution limit (Nyquist limit) i.e., with largest diffraction angle, where the binary phase profile is the only alternative. We use the Fourier transform theory to analyze the binary phase grating in a pixelated device in terms of the pixel size, fill factor and phase difference between the two levels in the grating.
Experimental verification is provided by encoding binary phase triplicator gratings with different periods on a high-resolution liquid-crystal on silicon SLM. The effect of the device pixelation and pixel crosstalk on the diffraction efficiency and on the conditions to obtain a Nyquist triplicator phase grating are studied.
This paper is part of the PhD Thesis developed by Shang Gao.