TecnOpto collaborates in a paper in OLEN of UAB MIP-Optilab about the indices of polarization purity
Esther Nabadda and Ignacio Moreno collaborated in the work entitled Connecting the microscopic depolarizing origin of samples with macroscopic measures of the Indices of Polarimetric Purity, published on the journal Optics & Lasers in Engineering. The work was leaded by our colleagues Juan Campos and Angel Lizana at UAB MIP-Optilab, in the frame of our coordinated joint research project.
In this work the indices of polarimetric purity (IPP) are analyzed as metrics to study the depolarization characteristic of media. It shows two different depolarizing origins: isotropic and anisotropic depolarization. The former, isotropic depolarization is related to pure scattering processes. Anisotropic depolarization is originated by microscopic constituent elements showing polarimetric anisotropy (dichroic and/or birefringent elements with different characteristics) and anisotropic scattering produced by these elements.
TecnOpto contributed to the experimental validation with radial polarizer and radial retarder measured with a Mueller matrix imaging polarimeter.