New paper in JEOS-RP describing an imaging Mueller polarimeter with self-calibration based on a polarization camera
Our last paper entitled Mueller matrix imaging polarimeter with polarization camera self-calibration applied to structured light components is published at JEOS-RP. The paper is open access and available at PDF
The work presents a complete Mueller matrix imaging polarimeter that uses three liquid-crystal retarders and a polarization camera. The polarimeter is characterized and optimized with a standard correction procedure here adapted to be performed fully in-situ, without any additional element, based on considering the polarization camera as the reference. The accuracy limit caused by the extinction ratio in the camera micro-polarizers is analyzed. Finally, the imaging polarimeter is tested experimentally by analyzing well-known samples for structured light applications such as patterned retarders, a patterned polarizer, and a liquid-crystal depolarizer. The work is presented in a tutorial style useful to reproduce the procedure by non-experts in polarimetry.
This paper is part of the PhD Thesis of Esther Nabadda, and it has been done in collaboration with our colleagues Asticio Vargas, from the Universidad de La Frontera in Chile, and Angel Lizana and Juan Campos from Universitat Autònoma de Barcelona.
viernes, 15 de marzo de 2024